6. An experimental and computational method for predicting the characteristics of dielectric products in the millimeter wave band
Date of receipt of the article for publication: 05.09.2026
Date of acceptance of the article for publication after review: 15.10.2026
Date of publication: 02.11.2026
ISSN: 2617-5525
e-ISSN: 2617-5533
Khardikov V. V.1 ORCID, Osinovyy H. H.2 ORCID, Kozis K. V.2 ORCID, Derevianko I. I.2 ORCID, Kalynychenko D. S.2 ORCID, Vinnichenko S. O.2 ORCID
Karazin Kharkiv National University, Kharkiv, Ukraine 1, Yuzhnoye State Design Office, Dnipro, Ukraine2
Page: Kosm. teh. Raket. vooruž. 2026, (1); 49-60
Language: Ukrainian
Key words: rocket, space and aircraft technologies, dielectric materials, complex permittivity, millimeter wave band, free-space measurements, vector network analyzer, electromagnetic simulation
1. Liu X., Gan L., Yang B. Millimeter-wave free-space dielectric characterization. Measurement. 2021. Vol. 179. Art. 109472. https://doi.org/10.1016/j.measurement.2021.109472
2. Anferov A., Harvey S. P., Wan F., Lee K. H., Simon J. Schuster D. I. Low-loss millimeterwave resonators with an improved coupling structure. Superconductor Science and Technology. 2024. Vol. 37, Iss. 3. Art. 035013. https://doi.org/10.1088/1361-6668/ad22ff
3. Zwick T., Chandrasekhar A., Baks C. W., Pfeiff er U. R., Brebels S., Gaucher B. Determination of the complex permittivity of packaging materials at millimeter-wave frequencies. IEEE Transactions on Microwave Theory and Techniques. 2006. Vol. 54, Iss. 3. Р. 1001–1010. https://doi.org/10.1109/tmtt.2005.864140
4. Mirbeik-Sabzevari A., Tavassolian N.Characterization and Validation of the Slim-Form Open-Ended Coaxial Probe for the Dielectric Characterization of Biological Tissues at Millimeter-Wave Frequencies. IEEE Microwave and Wireless Components Letters. 2018. Vol. 28, Iss. 1. Р. 85–87. https://doi.org/10.1109/lmwc.2017.2772187
5. Dudeck K. E., Buckley L. J. Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths. IEEE Transactions on Instrumentation and Measurement. 1992. Vol. 41, Iss. 5. Р. 723–725. https://doi.org/10.1109/19.177352
6. Kim S., Novotny D., Gordon J. A., Guerrieri J. R. A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data. IEEE Transactions on Antennas and Propagation. 2016. Vol. 64, Iss. 9. Р. 3869–3879. https://doi.org/10.1109/tap.2016.2587745
7. Hehenberger S. P., Caizzone S., Thurner S., Yarovoy A. G. Broadband Eff ective Permittivity Simulation and Measurement Techniques for 3-D-Printed Dielectric Crystals. IEEE Transactions on Microwave Theory and Techniques. 2023. Vol. 71, Iss. 10. Р. 4161–4172. https://doi.org/10.1109/tmtt.2023.3259479.
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